IEC60950-1 Test Pin For Information Technology Equipment Test Tip Diameter 3mm

IEC60950-1 Test Pin For Information Technology Equipment Test , Tip Diameter 3mm

IEC60950-1 clause 2.1.1.1 Access to energized parts

c) A test with the test pin, Figure 2B, which shall not contact bare parts at HAZARDOUS VOLTAGES when applied to openings in an external ELECTRICAL ENCLOSURE . Parts that can be detached by an OPERATOR , including fuseholders and lamps, are left in place, and OPERATOR access doors and covers are closed during this test. Test Finger Probe

The test finger, the test pin and the test probe are applied as above, without appreciable force, in every possible position, except that floor-standing equipment having a mass exceeding 40 kg is not tilted.
Equipment intended for building-in or rack-mounting, or for incorporation in larger equipment, is tested with access to the equipment limited according to the method of mounting detailed in the installation instructions. Test Finger Probe

Where contact between the test tool and the part is not permitted in the above tests, there is no requirement for a minimum air gap for voltages not exceeding 1 000 V a.c. or 1 500 V d.c.
For higher voltages, there shall be an air gap between the part at HAZARDOUS VOLTAGE and the test finger, Figure 2A, or the test pin, Figure 2B, placed in its most unfavourable position. This air gap, see Figure 2D

Standard:

Conforms to IEC 60065 clause 9.1.1.2, IEC61032 figure 9 Test probe13, IEC60950-1 figure 2B, IEC60335. Test Finger Probe

Application:

This pin is intended to verify the protection against access to hazardous live parts in class 0 equipment and class II equipment.

Test sample:

Easily accessible enclosure live parts or mechanical parts. Test Finger Probe

Feature:

It can be used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamometer).

Parameters:

Picture for reference: