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IEC62151 Figure 3 - Test Probe - Length 80mm Diameter 12mm - For Information Technology Equipment
IEC62151 clause 4.2.2.1 Accessibility
The equipment shall be so constructed that in USER ACCESS AREAS there is adequate protection against contact with bare parts of TNV - 1 , TNV - 2 and
TNV - 3 CIRCUITS except that access is permitted to: Test Finger Probe
– contacts of connectors which cannot be touched by the test probe (figure 3);
– bare conductive parts in the interior of a battery compartment that complies with 4.2.2.2;
– bare conductive parts of TNV - 1 CIRCUITS that are connected to a PROTECTIVE EARTHING terminal;
– bare conductive parts of TNV - 1 CIRCUIT connectors that are separated from unearthed ACCESSIBLE conductive parts of the equipment in accordance with 4.2.1 .2; Test Finger Probe
Compliance is checked by inspection, by measurement and by means of the test finger (IEC 61032, test probe B) applied as specified in the compliance section of the relevant equipment standard), and the test probe, figure 3.
Standard:Conforms to IEC60065: 2014 Annex B, IEC62151 figure 3 and UL6500 figure B.1.
Application:It is used for the bare parts of TNV circuits of information technology equipment to see whether they have sufficient protection.
Test sample:Information technology equipment.
Feature:Nylon handle + stainless steel probe. Test Finger Probe
Parameters:
| Model | HT-I23 |
| Probe length | 80 Test Finger Probe |
| End radius | R6 |
| Probe diameter | Φ12 |
| Baffle diameter of the handle | 50 |
