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IEC60529-1 Test Finger Probe Test Finger Probe B With Force Of 10N , 20N , 30N
Standard: IEC 61032 figure 2, IEC60950 figure 2A, IEC60884, IEC60335, UL507, and UL1278 figure 8.4.
Application: This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.
Test sample: Easily accessible enclosure live parts or mechanical parts.
Feature: This test finger probe consists of dito, finger, base and insulated handle which simulates the characteristics of the human hand. It has two movable joints, which can be curved at 90°. Customizable: it can be used for anti-electric shock test when equipped with pluggable banana plugs and amphenol connector at the end of the handle , or used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamometer).
Parameters(mm):
| Model | HT-I02 | HT-I02A | HT-I02B | HT-I02T |
| Name | Standard Test Finger | Circular Baffle Test finger | Large Baffle Test Finger | Standard Test Finger With Force |
| Joint 1 | 30±0.2 | 30±0.2 | 30±0.2 | 30±0.2 |
| Joint 2 | 60±0.2 | 60±0.2 | 60±0.2 | 60±0.2 |
| Finger length | 80±0.2 | 80±0.2 | 100±0.2 | 80±0.2 |
| Fingertip to baffle | 180±0.2 | 180±0.2 | ---- | 180±0.2 |
| Cylindrical | R2±0.05 | R2±0.05 | R2±0.05 | R2±0.05 |
| Spherical | R4±0.05 | R4±0.05 | R4±0.05 | R4±0.05 |
| Fingertip cutting bevel angle | 37o 0 -10′ | 37o 0 -10′ | 37o 0 -10′ | 37o 0 -10′ |
| Fingertip taper | 14 o 0 -10′ | 14 o 0 -10′ | 14 o 0 -10′ | 14 o 0 -10′ |
| Test finger diameter | Ф12 0 -0.05 | Ф12 0 -0.05 | Ф12 0 -0.05 | Ф12 0 -0.05 |
| A-A Section diameter | Ф50 | Ф50 | ---- | Ф50 |
| A-A Section width | 20±0.2 | ---- | ---- | 20±0.2 |
| Baffle diameter | Ф75±0.2 | Ф75±0.2 | Ф125±0.2 | Ф75±0.2 |
| Baffle thickness | 5±0.5 | 5±0.5 | ---- | 5±0.5 |
| Force | ---- | ---- | ---- | With force of 10N, 20N,30N |
| Applied standard | IEC61032-1 | IEC60335-1 | IEC60335-2-14 | IEC60529-1 |
